Title :
Failure Mechanisms Study of a Standard GaAs IC Technology
Author :
Kervarrec, G. ; Dumas, J.M. ; Boulaire, J.Y. ; Briesse, J.F.
Author_Institution :
Centre National d´´Etudes des Télécommunications - BP 40 - 22301 LANNION - FRANCE
Abstract :
After more than ten years of research and development in many laboratories, GaAs logic integrated circuits are becoming available for high speed logic applications. Reliability is one of the requirements needed for their introduction in systems and this is the purpose of this contribution.
Keywords :
Aging; Degradation; FETs; Failure analysis; Gallium arsenide; Life testing; Logic circuits; Logic devices; Logic testing; Metallization;
Conference_Titel :
Solid State Device Research Conference, 1987. ESSDERC '87. 17th European
Conference_Location :
Bologna, Italy
