Title :
A technique for the analysis of the scattering from gently undulated finite surfaces
Author :
Tiberi, Gianluigi ; Monorchio, Agostino ; Manara, Giuliano
Author_Institution :
Dept. of Inf. Eng., Pisa Univ., Italy
Abstract :
One of the frequently encountered problems in radar applications is that of determining the radar cross section (RCS) of objects with finite size and whose surfaces are not really flat. The method of moments (MoM)-based calculations are widely used, but if the surface to be analyzed becomes large in size, the CPU memory and runtimes increase dramatically. We introduce a novel approach to calculate the induced current density on gently undulated finite surfaces. This approach is based on the plane wave spectral (PWS) decomposition and on the small perturbation (SP) theory. First, we replace the original finite surface by an infinite one, but illuminated by a windowed excitation field; then, for each plane wave spectral component we calculate the induced current density via the SP theory. Finally, we sum these current densities with the appropriate phase shift and weight, to get the total induced current. Once the total induced current is known, other related parameters, as for instance the RCS, can be easily calculated.
Keywords :
conducting bodies; current density; electromagnetic induction; electromagnetic wave scattering; integral equations; method of moments; radar cross-sections; spectral analysis; CPU memory; EM scattering analysis; MoM; RCS; finite perfectly conducting surfaces; gently undulated finite surfaces; induced current density; method of moments; phase shift; plane wave spectral component; plane wave spectral decomposition; radar applications; radar cross section; small perturbation theory; statistical variables; windowed excitation field; Current density; Geometry; Information analysis; Moment methods; Polarization; Radar applications; Radar cross section; Radar scattering; Runtime; Surface waves;
Conference_Titel :
Antennas and Propagation Society International Symposium, 2002. IEEE
Print_ISBN :
0-7803-7330-8
DOI :
10.1109/APS.2002.1016978