Title :
Prediction of Soft Error Rate of 4 Mbit DRAM
Author :
Krautschneider, W.H. ; Meyberg, W.
Author_Institution :
Siemens AG, Central Research and Development, Otto-Hahn-Ring 6, D-8000 Munich 83, FRG
Abstract :
A method has been developed for estimation of soft error rate of memory chips. At special test structures which are as simply designed as possibly the charge collection induced by alpha strikes is measured. From these data the soft error rate can be calculated.
Keywords :
Alpha particles; Charge measurement; Current measurement; Error analysis; Particle measurements; Probes; Random access memory; Signal processing; Testing; Voltage;
Conference_Titel :
Solid State Device Research Conference, 1987. ESSDERC '87. 17th European
Conference_Location :
Bologna, Italy
