Title :
Ultrashort pulse characterization
Author_Institution :
Dept. of Phys., Istanbul Tech. Univ., Istanbul, Turkey
Abstract :
Summary form only given. Response times of electronic detectors are still orders of magnitude behind the time scales achieved in ultrafast optics, spanning picosecond femtosecond and attosecond ranges [1]. As a result, special characterization methods are needed for measuring such extreme short durations [2]. Most characterization methods stem from the idea of autocerrelation; using an event to measure itself. However, today we have gone much further than the limited estimates from simple autocorelations. We can extract the complete temporal or spectral evolution of ultrashort pulses, including both the intensity and phase information in time and frequency domains. Even further, spatial and complete spatio-temporal evolutions can also be measured with high sensitivity, resolution and reliability (Fig.1). In this course, we will review principles of ultrashort pulse characterization and then detail on particular commonly used methods such as FROG, SPIDER and their relatives. We will also discuss additional considerations required for extremely short (near single cycle cycle regime), long/narrowband, and extremely complicated pulses.
Keywords :
frequency-domain analysis; high-speed optical techniques; laser beams; laser variables measurement; pulse measurement; time-domain analysis; FROG; SPIDER; attosecond ranges; complete spatio-temporal evolutions; electronic detectors; extreme short duration measurement; extremely complicated pulses; extremely short pulses; femtosecond ranges; frequency domains; intensity information; long/narrowband pulses; method reliability; method resolution; method sensitivity; phase information; picosecond ranges; simple autocorelations; special characterization methods; spectral evolution; time domains; time scales; ultrafast optics; ultrashort pulse characterization; Frequency measurement; Optical pulse generation; Optical variables measurement; Physics; Spatial resolution; Ultrafast optics; Ultraviolet sources;
Conference_Titel :
Lasers and Electro-Optics Europe (CLEO EUROPE/IQEC), 2013 Conference on and International Quantum Electronics Conference
Conference_Location :
Munich
Print_ISBN :
978-1-4799-0593-5
DOI :
10.1109/CLEOE-IQEC.2013.6802009