Dynamic pixel test pattern for CMOS image sensor

Author

Lee, KS ; Lee, HJ ; Jang, MJ ; Kim, JC ; Kim, ST ; Moon, JW ; Cho, IW ; Yoo, KD

Author_Institution

Hynix Semicond. Inc., Icheon, South Korea

fYear

2012

fDate

19-22 March 2012

Firstpage

111

Lastpage

113

Abstract

We propose a dynamic pixel test pattern for CIS (CMOS Image Sensor) to measure the performance of the pixel unit including TX (Transfer Transistor), DX (Amplifier Transistor), RX (Reset Transistor), SX (Select Transistor), FD (floating Diffusion) and PD (Photo Diode). The proposed TP (Test Pattern) was implemented and verified using a 90 nm CIS process. The proposed TP has well delivered the expected properties of pixel; blooming, pixel reset level, pixel output signal, pixel signal swing range and TX gate turn on pulse width which can only be guessed for a conventional TP. The measured parameters should help to optimize and improve the CIS design.

Keywords

CMOS analogue integrated circuits; CMOS image sensors; integrated circuit design; integrated circuit testing; photodiodes; CIS design improvement; CIS design optimization; CIS process; CMOS image sensor; TX gate turn; amplifier transistor; dynamic pixel test pattern; floating diffusion; photodiode; pixel output signal; pixel reset level; pixel signal swing range; pixel unit performance measurement; reset transistor; select transistor; transfer transistor; Cameras; Logic gates;

fLanguage

English

Publisher

ieee

Conference_Titel

Microelectronic Test Structures (ICMTS), 2012 IEEE International Conference on

Conference_Location

San Diego, CA

ISSN

1071-9032

Print_ISBN

978-1-4673-1027-7

Type

conf

DOI

10.1109/ICMTS.2012.6190617

Filename

6190617