DocumentCode
1941873
Title
A compact circuit for wafer-level monitoring of operational amplifier high-frequency performance using DC parametric test equipment
Author
Sparling, Z.G. ; Tyree, Vance C. ; Cox, Nathan ; Vernier, P. Thomas
Author_Institution
MOSIS Service, Univ. of Southern California, Marina del Rey, CA, USA
fYear
2012
fDate
19-22 March 2012
Firstpage
142
Lastpage
145
Abstract
A test structure has been developed to permit wafer-level measurement of the frequency response of an operational amplifier having a unity gain frequency on the order of 2 GHz using DC measurement equipment. This paper describes the design issues associated with implementing this test structure along with test data obtained from three commercial fabrication runs in 180 nm CMOS.
Keywords
CMOS analogue integrated circuits; UHF amplifiers; integrated circuit testing; operational amplifiers; CMOS; DC parametric test equipment; compact circuit; operational amplifier high frequency performance; wafer level monitoring; Attenuation measurement; CMOS integrated circuits; Floors; Frequency measurement; Frequency synchronization; Oscilloscopes; Reliability;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronic Test Structures (ICMTS), 2012 IEEE International Conference on
Conference_Location
San Diego, CA
ISSN
1071-9032
Print_ISBN
978-1-4673-1027-7
Type
conf
DOI
10.1109/ICMTS.2012.6190633
Filename
6190633
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