• DocumentCode
    1941879
  • Title

    The Influence of Emitter Sidewall Injection on Transistor Noise Figure

  • Author

    Claessen, H.R. ; Geelen, J.A.M. ; De Graaff, H.G.

  • Author_Institution
    Philips Research Laboratories, P.O. Box 80.000, 5600 JA Eindhoven - The Netherlands
  • fYear
    1987
  • fDate
    14-17 Sept. 1987
  • Firstpage
    897
  • Lastpage
    900
  • Keywords
    Bipolar transistors; Current measurement; Electrical resistance measurement; Geometry; Laboratories; Mercury (metals); Noise figure; Noise generators; Noise measurement; Thermal resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference, 1987. ESSDERC '87. 17th European
  • Conference_Location
    Bologna, Italy
  • Print_ISBN
    0444704779
  • Type

    conf

  • Filename
    5436783
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1941879