DocumentCode :
1941927
Title :
Session 6: RF
Author :
McAndrew, Colin ; Ohguro, Tatsuya
Author_Institution :
Freescale Semiconductor, USA
fYear :
2012
fDate :
19-22 March 2012
Firstpage :
159
Lastpage :
160
Abstract :
Start of the above-titled section of the conference proceedings record.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microelectronic Test Structures (ICMTS), 2012 IEEE International Conference on
Conference_Location :
San Diego, CA
ISSN :
1071-9032
Print_ISBN :
978-1-4673-1027-7
Type :
conf
DOI :
10.1109/ICMTS.2012.6190636
Filename :
6190636
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1941927
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