DocumentCode
1942280
Title
Failure Analysis of GaAlAs Emitters
Author
Conte, G. ; Fantini, F. ; Magistrali, F. ; Vanzi, M.
Author_Institution
Telettra S. p. A., Quality and Reliability Dept. - 20059 Vimercate - Italy
fYear
1987
fDate
14-17 Sept. 1987
Firstpage
1007
Lastpage
1010
Abstract
The techniques used in characterizing the GaAs based lasers and LED´s are described and failure analysis results are reported for devices coming from incoming inspection, qualification, equipment production and field application. A detailed classification of failure modes and the correlation with failure mechanisms is shown by dividing among external overstresses, package and die-related problems.
Keywords
Electron optics; Failure analysis; Gallium arsenide; Inspection; Optical microscopy; Optical surface waves; Packaging; Scanning electron microscopy; Surface emitting lasers; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid State Device Research Conference, 1987. ESSDERC '87. 17th European
Conference_Location
Bologna, Italy
Print_ISBN
0444704779
Type
conf
Filename
5436803
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