• DocumentCode
    1942453
  • Title

    Towards Ranking the Importance of Patents

  • Author

    He, Xiaoyun ; Zhang, Feng ; Adam, Nabil

  • Author_Institution
    Rutgers Bus. Sch., Rutgers Univ., Newark, NJ
  • fYear
    2008
  • fDate
    28-29 Sept. 2008
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    The patents have long been recognized as a rich and potentially fertile source of data for the study of innovation and technological evolution, which, in turn, would eventually bring value to business. In particular, patent data includes citations to previous patents and to other scientific literature, and patent citations allow one to create an indicator of the "importance" of individual patents. However, existing methods of measuring the importance of patents simply count the number of citations, which is insufficient to capture the large variance in the technological and economic significance of individual patents. In this paper, we propose a ranking-based metric to measure the importance of patents. The metric not only takes into account of the citation counts, also considers the importance ranking score of citing patents. That is, the importance of patents propagates through the citation links. Using the defined ranking-based measure, we conduct an empirical study to show the effects of forward truncation problem in real patent citations data.
  • Keywords
    citation analysis; classification; patents; citation; patent importance ranking; ranking-based metric; scientific literature; Couplings; Data analysis; Displays; Economic indicators; Helium; Scattering; Search engines; Solids; Statistical analysis; Technological innovation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Management of Information for Globalized Enterprises, 2008. AMIGE 2008. IEEE Symposium on
  • Conference_Location
    Tianjin
  • Print_ISBN
    978-1-4244-3694-1
  • Electronic_ISBN
    978-1-4244-2972-1
  • Type

    conf

  • DOI
    10.1109/AMIGE.2008.ECP.53
  • Filename
    4721495