DocumentCode
1942453
Title
Towards Ranking the Importance of Patents
Author
He, Xiaoyun ; Zhang, Feng ; Adam, Nabil
Author_Institution
Rutgers Bus. Sch., Rutgers Univ., Newark, NJ
fYear
2008
fDate
28-29 Sept. 2008
Firstpage
1
Lastpage
5
Abstract
The patents have long been recognized as a rich and potentially fertile source of data for the study of innovation and technological evolution, which, in turn, would eventually bring value to business. In particular, patent data includes citations to previous patents and to other scientific literature, and patent citations allow one to create an indicator of the "importance" of individual patents. However, existing methods of measuring the importance of patents simply count the number of citations, which is insufficient to capture the large variance in the technological and economic significance of individual patents. In this paper, we propose a ranking-based metric to measure the importance of patents. The metric not only takes into account of the citation counts, also considers the importance ranking score of citing patents. That is, the importance of patents propagates through the citation links. Using the defined ranking-based measure, we conduct an empirical study to show the effects of forward truncation problem in real patent citations data.
Keywords
citation analysis; classification; patents; citation; patent importance ranking; ranking-based metric; scientific literature; Couplings; Data analysis; Displays; Economic indicators; Helium; Scattering; Search engines; Solids; Statistical analysis; Technological innovation;
fLanguage
English
Publisher
ieee
Conference_Titel
Advanced Management of Information for Globalized Enterprises, 2008. AMIGE 2008. IEEE Symposium on
Conference_Location
Tianjin
Print_ISBN
978-1-4244-3694-1
Electronic_ISBN
978-1-4244-2972-1
Type
conf
DOI
10.1109/AMIGE.2008.ECP.53
Filename
4721495
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