Title :
Microcavity optoelectronic devices
Author :
Coldren, L.A. ; Young, D.B. ; Peters, M.G. ; Peters, F.H. ; Scott, J.W. ; Barron, C.C. ; Thibeault, B.J. ; Corzine, S.W.
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA
Abstract :
Over the past few years vertical-cavity surface-emitting lasers and modulators have emerged as viable devices with interesting performance characteristics. One of their key features is that they occupy very little substrate area as compared to most optoelectronic devices. As a result, they also require relatively low drive powers. These aspects together with their suitability for wafer-scale fabrication and testing make them appear suitable for low-cost production as well as high performance. In this paper we shall review recent progress on these devices with emphasis on the vertical-cavity laser. Vertical-cavity lasers with cw powers exceeding 110 mW, overall efficiencies exceeding 17%, operating temperatures exceeding 120°C, and output powers insensitive to temperature over ranges exceeding 60°C will be illustrated. In addition, devices have operated cw down to diameters of 2 μm, including a 6 μm device that delivers nearly 2 milliwatts of single-mode output power with greater than 30 dB of spurious mode suppression. In the vertical-cavity modulator area, reflective asymmetric Fabry-Perot structures have given up to 37 GHz of modulation bandwidth. Insertion losses are about 3 dB, and required voltage swings for 100:1 modulation are ~±2V
Keywords :
electro-optical devices; integrated optoelectronics; laser cavity resonators; laser modes; optical losses; optical modulation; semiconductor lasers; 100:1 modulation; 110 mW; 120 C; 17 percent; 2 mum; cw powers; high performance; insertion losses; low drive powers; low-cost production; microcavity optoelectronic devices; modulation bandwidth; modulators; operating temperatures; overall efficiencies; performance characteristics; reflective asymmetric Fabry-Perot structures; review; single-mode output power; spurious mode suppression; substrate area; vertical-cavity laser; vertical-cavity surface-emitting lasers; voltage swings; wafer-scale fabrication; wafer-scale testing; Microcavities; Optical device fabrication; Optoelectronic devices; Power generation; Power lasers; Production; Surface emitting lasers; Temperature distribution; Testing; Vertical cavity surface emitting lasers;
Conference_Titel :
High Speed Semiconductor Devices and Circuits, 1993. Proceedings., IEEE/Cornell Conference on Advanced Concepts in
Conference_Location :
Ithaca, NY
Print_ISBN :
0-7803-0894-8
DOI :
10.1109/CORNEL.1993.303062