Title :
Physical layer identification of embedded devices using RF-DNA fingerprinting
Author :
Cobb, William E. ; Garcia, Eric W. ; Temple, Michael A. ; Baldwin, Rusty O. ; Kim, Yong C.
Author_Institution :
Dept of Electr. & Comput. Eng., US Air Force Inst. of Technol., Wright-Patterson AFB, OH, USA
fDate :
Oct. 31 2010-Nov. 3 2010
Abstract :
RF distinct native attribute (RF-DNA) fingerprinting is introduced as a means to uniquely identify embedded processors and other integrated circuit devices by passively monitoring and exploiting unintentional RF emissions. Device discrimination is accomplished using RF-DNA fingerprints comprised of higher-order statistical features based on instantaneous amplitude and frequency responses as a device executes a sequence of operations. The resultant fingerprints are input to a Multiple Discriminant Analysis/Maximum Likelihood (MDA/ML) processor for subsequent device discrimination. Using devices from a given manufacturer and experimentally collected side channel signals, 90-100% identification accuracy is achieved for SNR ≥ 12 dB for devices with identical part numbers from the same production lot. Depending on the level of required classification accuracy, RF-DNA fingerprinting is well-suited for realistic environments and practical operating distances. Applications of device RF-DNA fingerprints include supplementary physical layer authentication of secure tokens (e.g. smart cards), detection of counterfeit electronic devices or unauthorized modification, and forensic attribution of a device´s unique identity in criminal or other investigations.
Keywords :
embedded systems; higher order statistics; integrated circuits; microprocessor chips; radiofrequency identification; RF distinct native attribute; RF-DNA fingerprinting; counterfeit electronic device detection; device discrimination; embedded devices; embedded processors; forensic attribution; higher-order statistical features; integrated circuit devices; maximum likelihood; multiple discriminant analysis; physical layer authentication; physical layer identification; secure tokens; side channel signals; unintentional RF emissions; Clocks; Feature extraction; Integrated circuits; Performance evaluation; Probes; Radio frequency; Signal to noise ratio;
Conference_Titel :
MILITARY COMMUNICATIONS CONFERENCE, 2010 - MILCOM 2010
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-8178-1
DOI :
10.1109/MILCOM.2010.5680487