Title :
CIT 1 and CIT 2, Advanced Non Epitaxial Bipolar/CMOS Processes for Analog-Digital VLSI
Author :
Volz, C. ; Blossfeld, L.
Author_Institution :
ITT Intermetall, Hans-Bunte-Strz. 19, D-7800 Freiburg, F.R.G.
Abstract :
Deux processus Bipolaire/CMOS de haute performance ont été développés; les processus CIT 1 (2.0 ¿m) et CIT 2 (1.5 ¿m). La technologie CIT n´utilise ni l´epitaxie ni le buried layer. Des transistors bipolaires (npn, pnp) et des transistors MOS (canal n, canal p) sont implantes avec succes sur un meme chip sans diminuer les performances des deux technologies en présence. Two N-well high performance Bipolar/CMOS processes have been developed; a 2.0 ¿m CIT 1 process and CIT 2, a 1.5 ¿m process. CIT technology uses neither epitaxie nor buried layer. Bipolar transistors (npn and pnp) and MOS transistors (n-channel and p-channel) have been sucessfully fabricated on the same chip without a decrease of the performance.
Keywords :
Analog-digital conversion; Bipolar transistors; CMOS process; CMOS technology; Conductivity; Ion implantation; Irrigation; MOSFETs; Silicides; Very large scale integration;
Conference_Titel :
Solid State Device Research Conference, 1988. ESSDERC '88. 18th European
Conference_Location :
Montpellier, France