• DocumentCode
    1943749
  • Title

    Novel metal/2-DEG junction transistors

  • Author

    Peatman, W.C.B. ; Park, H. ; Gelmont, B. ; Shur, M. ; Maki, P. ; Brown, E.R. ; Rooks, M.J.

  • Author_Institution
    Dept. of Electr. Eng., Virginia Univ., Charlottesville, VA, USA
  • fYear
    1993
  • fDate
    2-4 Aug 1993
  • Firstpage
    314
  • Lastpage
    319
  • Abstract
    We present here the research on new metal/2-dimensional electron gas (2-DEG) Schottky contacts. This new high speed contact has unique characteristics which are particularly promising for applications in the fields of millimeter wave electronics and high speed, low power integrated circuits. We describe here two new transistors which utilize a side-gate formed by plating gate metal into a trench etched through the plane of the 2-DEG. The first transistor is the Schottky-gated resonant tunneling transistor (SG-RTT) which has demonstrated high transconductance and novel switching properties at room temperature. The second device is a novel 2-dimensional metal-semiconductor field effect transistor (2-D MESFET) which is particularly promising for low power, high speed integrated circuit applications. We also briefly discuss several applications of these new transistors
  • Keywords
    MMIC; Schottky gate field effect transistors; field effect integrated circuits; high electron mobility transistors; hot electron transistors; resonant tunnelling devices; solid-state microwave devices; Schottky contacts; Schottky-gated resonant tunneling transistor; high speed contact; high speed integrated circuits; metal/2-DEG junction transistors; millimeter wave electronics; side-gate; transconductance; two-dimensional metal-semiconductor field effect transistor; Electrons; Etching; FETs; Millimeter wave integrated circuits; Millimeter wave transistors; Power integrated circuits; Resonant tunneling devices; Schottky barriers; Temperature; Transconductance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Speed Semiconductor Devices and Circuits, 1993. Proceedings., IEEE/Cornell Conference on Advanced Concepts in
  • Conference_Location
    Ithaca, NY
  • Print_ISBN
    0-7803-0894-8
  • Type

    conf

  • DOI
    10.1109/CORNEL.1993.303101
  • Filename
    303101