Title :
Critical path tracing in sequential circuits
Author :
Menon, P.R. ; Levendel, Y. ; Abramovici, M.
Author_Institution :
Massachusetts Univ., Amherst, MA, USA
Abstract :
Critical path tracing has been shown to be faster than traditional fault simulation methods, but it produces pessimistic results in some cases involving reconvergent fanout. It is shown that the pessimistic nature of critical path tracing in combinational circuits can lead to incorrect results that are not necessarily pessimistic in sequential circuits. A modification of the method for removing the approximation is proposed, and a critical path tracing algorithm for synchronous sequential circuits is presented.<>
Keywords :
circuit analysis computing; critical path analysis; digital simulation; fault location; sequential circuits; approximation; critical path tracing algorithm; fault simulation; reconvergent fanout; synchronous sequential circuits; Approximation algorithms; Circuit faults; Circuit simulation; Circuit testing; Combinational circuits; Computational modeling; Electrical fault detection; Fault detection; Performance evaluation; Sequential circuits;
Conference_Titel :
Computer-Aided Design, 1988. ICCAD-88. Digest of Technical Papers., IEEE International Conference on
Conference_Location :
Santa Clara, CA, USA
Print_ISBN :
0-8186-0869-2
DOI :
10.1109/ICCAD.1988.122485
