Title :
New reflow soldering and tip in buried box (TB2) techniques for ultrafine pitch megapixels imaging array
Author :
Saint-Patrice, D. ; Marion, F. ; Fendler, M. ; Dumont, G. ; Garrione, J. ; Mandrillon, V. ; Greco, F. ; Diop, M. ; Largeron, C. ; Ribot, H.
Author_Institution :
CEA, LETI, Grenoble
Abstract :
Flip chip is a high-density and highly reliable interconnection technology which is mandatory for the fabrication of high end heterogeneous imaging arrays. The control of ultra-fine pitch (<10 mum) and high bumps count flip-chip bonding technology represents a challenge on the roadmap of next generation devices (Kozlowski). This paper describes and compares in details two new flip- chip technologies that can address the challenges at the 10 mum pitch node: a modified reflow soldering technology and a thermocompression "tip in buried box" (TB2) insertion technology. The technological preparation of the flip-chipped devices is fully described including new maskless underbump metallization (UBM) technique, new maskless soft solder buried box filling technique and new "micro-tube" fabrication technique. First the flip chip experiments are described as well as two methods to evaluate minimum insertion force for the TB2 technology: 500times500 area arrays insertion/ pull out forces are measured as well as original "single tip into solder" insertion/ pull out forces. The reduction of the required thermocompression forces obtained with "micro-tube" is demonstrated, finally first reflow and thermocompression hybridization results are achieved and commented.
Keywords :
flip-chip devices; lead bonding; soldering; flip-chip bonding technology; heterogeneous imaging arrays; interconnection technology; maskless soft solder buried box filling technique; micro-tube fabrication; reflow soldering technology; thermocompression hybridization; thermocompression insertion technology; tip in buried box techniques; ultra-fine pitch; ultrafine pitch megapixels imaging array; underbump metallization; Assembly; Bonding; Chemical technology; Fabrication; Flip chip; Force measurement; Inorganic materials; Metallization; Reflow soldering; Temperature;
Conference_Titel :
Electronic Components and Technology Conference, 2008. ECTC 2008. 58th
Conference_Location :
Lake Buena Vista, FL
Print_ISBN :
978-1-4244-2230-2
Electronic_ISBN :
0569-5503
DOI :
10.1109/ECTC.2008.4549949