DocumentCode :
1944219
Title :
Compact Modeling of Quasi-Ballistic Transport and Quantum Mechanical Confinement in Nanowire MOSFETs: Circuit Performances Analysis
Author :
Martinie, S. ; Sarrazin, E. ; Munteanu, D. ; Barraud, S. ; Le Carval, G. ; Autran, J.L.
Author_Institution :
LETI, CEA, Grenoble, France
fYear :
2009
fDate :
9-11 Sept. 2009
Firstpage :
1
Lastpage :
4
Abstract :
In this paper we develop a compact model for ballistic/quasi-ballistic transport in nanowire. Starting from the well-known approach of Natori/Lundstrom, we enhanced it by including an original modeling of SCE/DIBL (Short Channel Effect and Drain Barrier Lowering), scattering mechanisms and quantum mechanical confinement. Our drain current model has been validated by comparisons with numerical simulations at device and circuit levels. Finally, we used our model to simulate simple circuit elements and to evaluate the impact of Nanowire architecture on the device and circuit performances.
Keywords :
MOSFET; ballistic transport; nanotechnology; nanowires; Natori-Lundstrom approach; ballistic transport; circuit elements; circuit performances analysis; compact model; drain barrier lowering; drain current model; nanowire MOSFET; quantum mechanical confinement; quasiballistic transport; scattering mechanisms; short channel effect; Circuit analysis; Circuit simulation; MOSFETs; Nanoscale devices; Numerical simulation; Particle scattering; Performance analysis; Performance evaluation; Potential well; Quantum mechanics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Simulation of Semiconductor Processes and Devices, 2009. SISPAD '09. International Conference on
Conference_Location :
San Diego, CA
ISSN :
1946-1569
Print_ISBN :
978-1-4244-3974-8
Electronic_ISBN :
1946-1569
Type :
conf
DOI :
10.1109/SISPAD.2009.5290229
Filename :
5290229
Link To Document :
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