Title :
Structural dependence of the thermal resistance of vertical cavity surface emitting lasers
Author :
Lascola, K.M. ; Yuen, W. ; Chang-Hasnain, C.J.
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
Abstract :
Thermal effects are well known to limit peak output power and efficiency of vertical cavity surface emitting lasers (VCSELs). However, they are often disregarded in VCSEL design. In this work, using a simple thermal model, we consider the effect of device structure (both geometry and layer composition) on the thermal properties of VCSELs and verify the validity of the model by comparing with experimental results.
Keywords :
distributed Bragg reflector lasers; laser cavity resonators; quantum well lasers; semiconductor device models; surface emitting lasers; thermal resistance; Al/sub 0.7/Ga/sub 0.3/As-GaAs; AlAs-GaAs; VCSEL; device structure; efficiency; geometry; layer composition; peak output power; structural dependence; thermal effects; thermal properties; thermal resistance; vertical cavity surface emitting lasers; Gallium arsenide; Laser modes; Mirrors; Solid modeling; Surface emitting lasers; Surface resistance; Temperature; Thermal conductivity; Thermal resistance; Vertical cavity surface emitting lasers;
Conference_Titel :
Vertical-Cavity Lasers, Technologies for a Global Information Infrastructure, WDM Components Technology, Advanced Semiconductor Lasers and Applications, Gallium Nitride Materials, Processing, and Devi
Conference_Location :
Montreal, Que., Canada
Print_ISBN :
0-7803-3891-X
DOI :
10.1109/LEOSST.1997.619114
