Title :
Fast and accurate characterization of optical components using low-coherence interferometry
Author :
Dyer, S.D. ; Espejo, R.J.
Author_Institution :
Optoelectronics Div., Nat. Inst. of Stand. & Technol., Boulder, CO, USA
Abstract :
Low-coherence interferometry yields a high-resolution measurement of a component´s spectral and dispersion properties. We show that this technique can be applied to cascaded components, and this measurement is not adversely affected by other components in the system.
Keywords :
Michelson interferometers; diffraction gratings; light coherence; light interferometry; measurement errors; multiplexing equipment; optical fibre dispersion; optical fibre testing; Michelson interferometer; accurate characterization; add/drop multiplexers; cascaded components; dispersion properties; fast characterization; fiber optic telecommunications system; gratings; high-resolution measurement; low-coherence interferometry; optical components; spectral properties; Bragg gratings; Dispersion; Fiber gratings; Optical devices; Optical fiber couplers; Optical fiber polarization; Optical fiber testing; Optical interferometry; Optical reflection; Reflectivity;
Conference_Titel :
Lasers and Electro-Optics, 2001. CLEO/Pacific Rim 2001. The 4th Pacific Rim Conference on
Conference_Location :
Chiba, Japan
Print_ISBN :
0-7803-6738-3
DOI :
10.1109/CLEOPR.2001.967932
