Title :
Band-Tail Shockley-Read-Hall Recombination in Heavily Doped Silicon
Author :
Ghannam, M.Y. ; Mertens, R.P. ; Jain, S.C. ; Nijs, J.F. ; Van Overstraeten, R.
Author_Institution :
Electronics and Communications Department, Cairo University, Guiza, Egypt
Abstract :
Shockley-Read-Hall recombination center density due to the localized states in the minority carrier band tail has been calculated, It is shown that in heavily doped silicon, the effect of these band tail states is comparable to or more important than that due to deep states and modifies the lifetime of minority carriers significantly.
Keywords :
Charge carrier processes; Energy states; Equations; Fluctuations; Microelectronics; Photonic band gap; Radiative recombination; Silicon; Spontaneous emission; Tail;
Conference_Titel :
Solid State Device Research Conference, 1988. ESSDERC '88. 18th European
Conference_Location :
Montpellier, France