DocumentCode :
1944517
Title :
A comprehensive parallel study on the board level reliability of SAC, SACX and SCN solders
Author :
Song, Fubin ; Lo, Jeffery C C ; Lam, Jimmy K S ; Jiang, Tong ; Lee, S. W Ricky
Author_Institution :
Electron. Packaging Lab., Hong Kong Univ. of Sci. & Technol., Hong Kong
fYear :
2008
fDate :
27-30 May 2008
Firstpage :
146
Lastpage :
154
Abstract :
Legislation that mandates the banning of lead (Pb) in electronics due to environmental and health concerns has been actively pursued in many countries during the past fifteen years. Lead-free electronics will be deployed in many products that serve markets where the reliability is a critical requirement. Although a large number of research studies have been performed and are currently under way in the lead- free soldering area, especially on the reliability of SAC lead- free solder joints, data on comparison of SAC solders with other lead-free solders (such as SCN) is still scarce. This paper presents a systematic reliability study of lead- free solder joints with different solder alloys. The printed circuit board test assemblies include two kinds of components (QFN and PBGA), with different terminal metallurgies and five kinds of lead-free solder pastes (SAC305, SAC387, SACC, SACS and SCN). The results and analysis of different reliability tests (accelerated thermal cycling, package shear/pull, bending and drop tests) with five kinds of solders are discussed.
Keywords :
ball grid arrays; circuit reliability; circuit testing; copper alloys; lead alloys; plastic packaging; printed circuits; silver alloys; soldering; solders; tin alloys; PBGA; Pb; SAC solder joints; Sn-Ag-Cu; board level reliability; printed circuit board test assemblies; solder alloys; systematic reliability; thermal cycling; Assembly; Circuit testing; Consumer electronics; Electronic packaging thermal management; Environmentally friendly manufacturing techniques; Lead; Legislation; Life estimation; Printed circuits; Soldering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2008. ECTC 2008. 58th
Conference_Location :
Lake Buena Vista, FL
ISSN :
0569-5503
Print_ISBN :
978-1-4244-2230-2
Electronic_ISBN :
0569-5503
Type :
conf
DOI :
10.1109/ECTC.2008.4549961
Filename :
4549961
Link To Document :
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