DocumentCode :
1944644
Title :
Monte-Carlo Ion Implantation and Composite
Author :
Barthel, A. ; Lorenz, J. ; Ryssel, H.
Author_Institution :
Fraunhofer-Arbeitsgruppe fÿr Integrierte Schaltungen, Artilleriestrasse 12, D-8520 Erlangen, Germany
fYear :
1987
fDate :
14-17 Sept. 1987
Firstpage :
457
Lastpage :
460
Abstract :
Analytical methods for the description of ion implantation show good agreement with experiment and Monte-Carlo simulations in most cases. Problems arise with special geometries such as trenches. To be able to simulate implantation and diffusion in such cases, a Monte-Carlo interface has been added to the process simulation program COMPOSITE.
Keywords :
Analytical models; Boltzmann equation; Computational modeling; Convolution; Geometry; Ion implantation; Nonhomogeneous media; Physics computing; Semiconductor process modeling; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Device Research Conference, 1987. ESSDERC '87. 17th European
Conference_Location :
Bologna, Italy
Print_ISBN :
0444704779
Type :
conf
Filename :
5436910
Link To Document :
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