• DocumentCode
    1945008
  • Title

    Conductivity Mismatch and Voltage Dependence of Magnetoresistance in a Semiconductor Spin Injection and Detection Structure

  • Author

    Roy, Arunanshu M. ; Nikonov, Dmitri E. ; Saraswat, Krishna

  • Author_Institution
    Center for Integrated Syst., Stanford Univ., Stanford, CA, USA
  • fYear
    2009
  • fDate
    9-11 Sept. 2009
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This work studies the voltage dependence of magnetoresistance in a semiconductor spin injection and detection structure. The voltage dependence of the spin dependent interface resistance at a ferromagnet semiconductor interface is investigated and spin diffusion models are used to evaluate the voltage dependence of magnetoresistance. We find that the voltage dependence of magnetoresistance is similar to that in magnetic tunnel junctions. Using our model for spin injection in a ferromagnet-oxide-semiconductor junction, the variation of magnetoresistance ratio with semiconductor doping and oxide thickness has been studied.
  • Keywords
    electrical conductivity; ferromagnetic materials; magnetic multilayers; magnetoresistance; semiconductor doping; spin dynamics; spin polarised transport; conductivity mismatch; detection structure; ferromagnet semiconductor interface; ferromagnet-oxide-semiconductor junction; magnetic tunnel junctions; magnetoresistance; semiconductor doping; semiconductor spin injection; spin dependent interface resistance; spin diffusion models; voltage dependence; Conducting materials; Conductivity; Electrons; Equations; Gallium arsenide; Magnetoresistance; Mathematical model; Semiconductor process modeling; Spin polarized transport; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation of Semiconductor Processes and Devices, 2009. SISPAD '09. International Conference on
  • Conference_Location
    San Diego, CA
  • ISSN
    1946-1569
  • Print_ISBN
    978-1-4244-3974-8
  • Electronic_ISBN
    1946-1569
  • Type

    conf

  • DOI
    10.1109/SISPAD.2009.5290259
  • Filename
    5290259