DocumentCode

1945067

Title

Electron Traps, Structural Change, and Hydrogen Related Simox Defects

Author

Conley, J.F. ; Lenahan, P.M. ; Roitman, P.

Author_Institution

The Pennsylvania State University, PA

fYear

1992

fDate

6-8 Oct. 1992

Firstpage

26

Lastpage

27

Keywords

Charge carrier processes; Charge measurement; Current measurement; Electron traps; Hydrogen; Lighting; NIST; Paramagnetic materials; Paramagnetic resonance; Silicon;

fLanguage

English

Publisher

ieee

Conference_Titel

SOI Conference, 1992. IEEE International

Conference_Location

Ponte Vedra Beach, FL

ISSN

1078-621X

Print_ISBN

0-7803-7439-8

Type

conf

DOI

10.1109/SOI.1992.664778

Filename

664778