Title :
Monte Carlo Simulation of Semiconductor Devices: A Critical Review
Author :
Lugli, Paolo ; Jacoboni, Carlo
Author_Institution :
Dipartimento di Fisica e Centro Interuniversitario di Struttura della Materia dell´´Universita´´ di Modena, Via Campi 213/A, 41100 Modena, Italy, Via Campi 213/A, 41100 Modena, Italia
Abstract :
We present a critical discussion of the Monte Carlo simulation as applied to semiconductor device modelling. The advantages and limitations of such approach are discussed and compared with more traditional simulators. Critical points are pointed out and analyzed. A variety of applications to different structures is then outlined.
Keywords :
Boundary conditions; Electromagnetic compatibility; Electrons; Electrostatics; Jacobian matrices; Monte Carlo methods; Particle scattering; Poisson equations; Semiconductor devices; Shape;
Conference_Titel :
Solid State Device Research Conference, 1987. ESSDERC '87. 17th European
Conference_Location :
Bologna, Italy
