Title :
III-V Compound Devices on Silicon : Situation and Perspectives
Author :
Hirtz, P. ; Charasse, M.N.
Author_Institution :
Laboratoire Central de Recherche, Thomson-CSF, Domaine de Corbeville, F-91401 Orsay Cedex, France
Keywords :
Crystallography; Gallium arsenide; III-V semiconductor materials; Molecular beam epitaxial growth; Rapid thermal annealing; Rapid thermal processing; Silicon; Substrates; Temperature; Thermal conductivity;
Conference_Titel :
Solid State Device Research Conference, 1988. ESSDERC '88. 18th European
Conference_Location :
Montpellier, France