• DocumentCode
    1945670
  • Title

    The superior drop test performance of SAC-Ti solders and its mechanism

  • Author

    Liu, Weiping ; Bachorik, Paul ; Lee, Ning-Cheng

  • Author_Institution
    Indium Corp. of America, Utica, NY
  • fYear
    2008
  • fDate
    27-30 May 2008
  • Firstpage
    452
  • Lastpage
    458
  • Abstract
    SAC-Ti alloys exhibited significantly improved drop test performance over not only SAC alloys, but also 63Sn37Pb for ENIG/OSP, NiAu/OSP, and OSP/OSP surface finish systems. The superior performance is attributed to (1) the increased grain size and dendrite size, therefore reduced hardness of solder, (2) inclusion of Ti in the IMC layer, and (3) reduced IMC layer thickness. DSC data indicate that the melting temperature and range were not affected by Ti, but the undercooling was almost completely suppressed. The creep properties of SAC-Ti alloy were comparable with those of SAC alloy, strongly suggesting the gain in drop test performance was not achieved by compromising the thermal fatigue performance. SAC-Mn alloys were also found to outperform SAC alloys and Sn63 for the X/OSP finish combinations studied. In general, SAC-Ti performed equally to or better than SAC-Mn alloys.
  • Keywords
    solders; titanium alloys; IMC layer; SAC-Ti alloys; SAC-Ti solders; Ti; superior drop test; surface finish systems; thermal fatigue performance; Assembly; Environmentally friendly manufacturing techniques; Fatigue; Indium; Lead; Soldering; Steel; Surface finishing; System testing; Titanium alloys; SAC; Solder; drop test; fragility; lead-free; tin-silver-copper;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2008. ECTC 2008. 58th
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4244-2230-2
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2008.4550011
  • Filename
    4550011