DocumentCode
1945670
Title
The superior drop test performance of SAC-Ti solders and its mechanism
Author
Liu, Weiping ; Bachorik, Paul ; Lee, Ning-Cheng
Author_Institution
Indium Corp. of America, Utica, NY
fYear
2008
fDate
27-30 May 2008
Firstpage
452
Lastpage
458
Abstract
SAC-Ti alloys exhibited significantly improved drop test performance over not only SAC alloys, but also 63Sn37Pb for ENIG/OSP, NiAu/OSP, and OSP/OSP surface finish systems. The superior performance is attributed to (1) the increased grain size and dendrite size, therefore reduced hardness of solder, (2) inclusion of Ti in the IMC layer, and (3) reduced IMC layer thickness. DSC data indicate that the melting temperature and range were not affected by Ti, but the undercooling was almost completely suppressed. The creep properties of SAC-Ti alloy were comparable with those of SAC alloy, strongly suggesting the gain in drop test performance was not achieved by compromising the thermal fatigue performance. SAC-Mn alloys were also found to outperform SAC alloys and Sn63 for the X/OSP finish combinations studied. In general, SAC-Ti performed equally to or better than SAC-Mn alloys.
Keywords
solders; titanium alloys; IMC layer; SAC-Ti alloys; SAC-Ti solders; Ti; superior drop test; surface finish systems; thermal fatigue performance; Assembly; Environmentally friendly manufacturing techniques; Fatigue; Indium; Lead; Soldering; Steel; Surface finishing; System testing; Titanium alloys; SAC; Solder; drop test; fragility; lead-free; tin-silver-copper;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2008. ECTC 2008. 58th
Conference_Location
Lake Buena Vista, FL
ISSN
0569-5503
Print_ISBN
978-1-4244-2230-2
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2008.4550011
Filename
4550011
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