• DocumentCode
    1945698
  • Title

    Temperature dependence of mechanical properties of individual phases in Sn-3.0Ag-0.5Cu lead-free solder alloy

  • Author

    Gao, Feng ; Nishikawa, Hiroshi ; Takemoto, Tadashi ; Qu, Jianmin

  • Author_Institution
    George W. Woodruff Sch. of Mech. Eng., Georgia Inst. of Technol., Atlanta, GA
  • fYear
    2008
  • fDate
    27-30 May 2008
  • Firstpage
    466
  • Lastpage
    471
  • Abstract
    The commercial Sn-3.0Ag-0.5Cu (SAC) lead-free solder alloy consists of Sn-rich and eutectic phases. The mechanical properties of these individual phases were demonstrated to be a function of the temperature. The nano-indentation equipment assembled with advanced-controlled hot-stage was utilized to examine the mechanical characteristics. The experiments were performed at 60degC, 80degC, 110degC, 130degC and 150degC, respectively. It was found that for both Sn-rich phase and eutectic phase, the mechanical properties, such as hardness and elastic modulus, exhibited the dependence on the temperature. In particular, the creep deformation at the dwell time of constant target load exhibited high sensitivity to the temperature. Generally, the higher temperature resulted in a larger creep deformation, which in turn impacted the strain rate sensitivity of the individual phases. The Sn-rich phase showed larger creep deformation than that of eutectic phase. However, the much larger strain rate sensitivity index value was obtained for eutectic phase at the lower temperature than 150degC. The activity energy of Sn-rich phase was derived based on the relation of strain rates versus temperature.
  • Keywords
    copper alloys; creep; elastic moduli; hardness; indentation; silver alloys; solders; tin alloys; SnAgCu; activity energy; creep; deformation; elastic modulus; eutectic phases; hardness; lead-free solder alloy; nano-indentation; strain rate sensitivity index; Assembly; Capacitive sensors; Creep; Environmentally friendly manufacturing techniques; Lead; Mechanical factors; Soldering; Temperature dependence; Temperature sensors; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2008. ECTC 2008. 58th
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4244-2230-2
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2008.4550013
  • Filename
    4550013