Title :
System level approach for assessing and mitigating differential skew for 10+ Gbps SerDes applications
Author :
Degerstrom, Michael J. ; Buhrow, Benjamin R. ; McCoy, Bart O. ; Zabinski, Patrick J. ; Gilbert, Barry K. ; Daniel, Erik S.
Author_Institution :
Mayo Clinic, Rochester, MN
Abstract :
Weave-induced skew on printed wiring boards (PWB) for 10+ Gbps SerDes data rates can be very significant. In this paper, we not only investigate weave-induced skew but also look at other sources of skew. We show the weave skew results taken from measurements of three different test boards. Results from a fourth board are presented to examine PWB differential via skew. Measurements from a fifth board are analyzed to determine total channel skew. We propose a budget such that a certain amount of skew can be tolerated with a small increase in channel insertion loss. We then present a case study to project overall performance on PWB yield. We observe a number of anomalies with our test results and suggest additional studies to guard against unpredicted high skew.
Keywords :
printed circuit design; semiconductor device manufacture; SerDes application; channel insertion loss; channel skew; differential skew; printed wiring board; system level; weave-induced skew; Dielectric constant; Dielectric materials; Glass; Insertion loss; Power measurement; Probes; Resins; Stripline; Testing; Wiring;
Conference_Titel :
Electronic Components and Technology Conference, 2008. ECTC 2008. 58th
Conference_Location :
Lake Buena Vista, FL
Print_ISBN :
978-1-4244-2230-2
Electronic_ISBN :
0569-5503
DOI :
10.1109/ECTC.2008.4550021