Title :
Evaluations of package technologies for power distribution network decoupling by measurement and correlation
Author :
Fediakine, Nikolai ; Shi, Hong
Author_Institution :
Altera Corp., San Jose, CA
Abstract :
A design of the proper frequency behavior of a power distribution network (PDN) of input/output (I/O) circuitry of an FPGA enhances performance and is able to withstand synchronous switching noise (SSN) for applications in specific frequency bandwidths. A methodology of PDN evaluation and modeling is presented in this paper, with different types of packages having on-package decoupling capacitance (OPD) of 10 nF (chip), and embedded on-package decoupling capacitances (EPD) of 10 nF (film), and 100 nF (chip) studied for evaluation. The working models of PDN in the 300 kHz-6 GHz range for all packages are designed and summarized in the paper. Direct measurement of chip PDN impedance is quite complicated because it requires applying wideband microprobes to a very small area. Instead, a power supply compression (PSC) measurement due to SSN in FPGA is used to view the impedance from the silicon side. This method is compared with indirect measurement of PDN done from the ball side. A second method requires standard 1 mm microprobes and VNA with the following processing of data and equivalent circuit reconstruction. This very elaborate technique clearly describes one peak PDN (neither OPD nor EPD), but requires additional tweaking to get the correct peak positions of packages with OPD (or EPD).
Keywords :
field programmable gate arrays; integrated circuit modelling; integrated circuit packaging; FPGA; capacitance 10 nF; capacitance 100 nF; chip PDN impedance; equivalent circuit reconstruction; field programmable gate array; frequency 300 kHz to 6 GHz; input/output circuitry; on-package decoupling capacitance; package technologies; power distribution network decoupling; power supply compression measurement; synchronous switching noise; wideband microprobes; Capacitance; Circuit noise; Field programmable gate arrays; Frequency; Impedance measurement; Packaging; Power measurement; Power systems; Semiconductor device measurement; Switching circuits;
Conference_Titel :
Electronic Components and Technology Conference, 2008. ECTC 2008. 58th
Conference_Location :
Lake Buena Vista, FL
Print_ISBN :
978-1-4244-2230-2
Electronic_ISBN :
0569-5503
DOI :
10.1109/ECTC.2008.4550024