Title :
An efficient method for power integrity and EMI Analysis of advanced packages
Author :
Liu, En-Xiao ; Wei, Xingchang ; Oo, Zaw Zaw ; Li, Er-Ping
Author_Institution :
Electromagn. & Electron. Syst. Programme, Inst. of High Performance Comput., Singapore
Abstract :
A two-dimensional full-wave method is presented in this paper for efficient power integrity and EMI Analysis of highspeed electronic packages. The power/ground planes in electronic packages form a parallel-plate structure, which is solved by a 2D finite-different time domain (2D FDTD) method. Both the conductor loss and the substrate loss are modeled by the 2D method. Besides the parallel-plate structure, electronic packages also comprise of many transmission lines including microstrip- and stripline-type structures. Those two types of structures are also resolved by the 2D method. So a unified solver may be developed in the context of 2D method for the signal and power integrity analysis of electronic packages. The electromagnetic interference (EMI) issue of electronic packages is also touched in this paper, which is mainly focused on the radiation due to the edge effect of the parallel plate structure in a package. Numerical examples are given to demonstrate the method.
Keywords :
electromagnetic interference; electronics packaging; finite difference time-domain analysis; transmission lines; 2D finite-different time domain; 2D full-wave method; EMI analysis; advanced packages; conductor loss; electromagnetic interference; highspeed electronic packages; microstrip-type structures; parallel-plate structure; power integrity analysis; power/ground planes; signal integrity analysis; stripline-type structures; substrate loss; transmission lines; Conductors; Electromagnetic interference; Electronics packaging; Finite difference methods; Microstrip; Power transmission lines; Signal analysis; Signal resolution; Stripline; Time domain analysis;
Conference_Titel :
Electronic Components and Technology Conference, 2008. ECTC 2008. 58th
Conference_Location :
Lake Buena Vista, FL
Print_ISBN :
978-1-4244-2230-2
Electronic_ISBN :
0569-5503
DOI :
10.1109/ECTC.2008.4550041