DocumentCode :
1946268
Title :
MUGEN: A high-performance fault-tolerant routing algorithm for unreliable Networks-on-Chip
Author :
Charif, Amir ; Zergainoh, Nacer-Eddine ; Nicolaidis, Michael
Author_Institution :
TIMA, Grenoble, France
fYear :
2015
fDate :
6-8 July 2015
Firstpage :
71
Lastpage :
76
Abstract :
NoCs (Networks-on-Chip) are an attractive alternative to communication buses for SoCs (Systems-on-Chip) as they offer both high scalability and low power consumption. However, designing such systems in the nanoscale era brings up some serious concerns about reliability. Our aim is to design robust NoCs while limiting performance degradation. In this paper, we introduce several techniques meant to increase the reliability and performance of NoCs. We combine these techniques to build a fault-tolerant, deadlock-free and congestion-aware routing algorithm called MUGEN. The algorithm comprises an optimized method to exchange messages between different virtual channel classes, a selection function that uses distant router link information to avoid dead-ends and a new congestion metric used to guide routing decisions towards less congested areas. We simulate an 8×8 Mesh NoC with fault injection to evaluate each method used by MUGEN individually before comparing the full algorithm with existing works from literature. We present promising results about the proposed techniques both in terms of fault-tolerance and performance.
Keywords :
fault tolerant computing; logic design; low-power electronics; network-on-chip; MUGEN; SoC; communication buses; congestion metric; congestion-aware routing algorithm; distant router link information; fault injection; fault-tolerant deadlock-free algorithm; high-performance fault-tolerant routing algorithm; low power consumption; mesh NoC; routing decisions; selection function; systems-on-chip; unreliable networks-on-chip; virtual channel classes; Fault tolerance; Measurement; Ports (Computers); Prediction algorithms; Recycling; Routing; Network-on-chip; adaptive routing; congestion; fault-tolerance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
On-Line Testing Symposium (IOLTS), 2015 IEEE 21st International
Conference_Location :
Halkidiki
Type :
conf
DOI :
10.1109/IOLTS.2015.7229835
Filename :
7229835
Link To Document :
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