Title :
CREST-a current estimator for CMOS circuits
Author :
Najm, F. ; Burch, R. ; Ping Yang ; Hajj, I.
Author_Institution :
Coord. Sci. Lab., Illinois Univ., Urbana, IL, USA
Abstract :
CREST is a pattern-independent current estimation approach developed to support electromigration analysis tools. It uses the powerful, original concept of probabilistic simulation to generate accurate estimates of the expected current waveforms efficiently. The original implementation of CREST is extended to circuits containing pass transistors, reconvergent fanout, and feedback, and heuristics to simulate circuits with large reconvergent fanout or feedback blocks efficiently are provided. The results of using CREST on several real circuits are presented.<>
Keywords :
CMOS integrated circuits; circuit analysis computing; digital simulation; electric current; electromigration; feedback; heuristic programming; probability; CMOS circuits; CREST; electromigration analysis tools; expected current waveforms; feedback blocks; heuristics; pass transistors; pattern-independent current estimation; probabilistic simulation; reconvergent fanout; Circuit simulation; Electromigration; Feedback circuits; Instruments; Integrated circuit reliability; Laboratories; Pattern analysis; Power generation; Probabilistic logic; Probability;
Conference_Titel :
Computer-Aided Design, 1988. ICCAD-88. Digest of Technical Papers., IEEE International Conference on
Conference_Location :
Santa Clara, CA, USA
Print_ISBN :
0-8186-0869-2
DOI :
10.1109/ICCAD.1988.122494
