• DocumentCode
    1946385
  • Title

    An integrated passive balun on Si, SiGe, and GaAs substrates

  • Author

    Li, Li ; Keyvani, Darioush ; Yoon, Jangsup ; Bhan, Vivek

  • Author_Institution
    Freescale Semicond. Inc., Tempe, AZ
  • fYear
    2008
  • fDate
    27-30 May 2008
  • Firstpage
    694
  • Lastpage
    700
  • Abstract
    This paper reports the design of a low loss, small size, and low cost dual balun for quad band GSM application. The balun was initially designed on a GaAs substrate for wirebond applications [1], and further design optimizations were conducted on a typical SiGe substrate and on high resistivity Si substrates to implement the balun fabrication in a conventional Si fab. The finalized balun using high resistivity Si substrates fabricated in Si fab, was used on a quad band GSM/EDGE transceiver module and on a WCDMA/EDGE transceiver module. These baluns on 8 inch Si wafers were bumped and flip chip assembled to the module substrates, which eliminated the conventional die attach and wirebond process. Flip chip assembly further decreases the form factor of the module. The designed flip chip balun on Si has comparable performance as the balun designed on GaAs substrate [1], with further size reduction by flip chip assembly.
  • Keywords
    3G mobile communication; Ge-Si alloys; III-V semiconductors; baluns; cellular radio; code division multiple access; flip-chip devices; gallium arsenide; passive networks; silicon compounds; transceivers; GSM-EDGE transceiver module; GaAs; Si; SiGe; WCDMA-EDGE transceiver module; balun fabrication; flip chip assembly; integrated passive balun; quad band GSM application; Assembly; Conductivity; Costs; Flip chip; GSM; Gallium arsenide; Germanium silicon alloys; Impedance matching; Silicon germanium; Transceivers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2008. ECTC 2008. 58th
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-4244-2230-2
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2008.4550048
  • Filename
    4550048