DocumentCode
1946425
Title
Statistical behavior of embeddedness and communities of overlapping cliques in online social networks
Author
Sridharan, Ajay ; Gao, Yong ; Wu, Kui ; Nastos, James
Author_Institution
Univ. of Victoria, Victoria, BC, Canada
fYear
2011
fDate
10-15 April 2011
Firstpage
546
Lastpage
550
Abstract
Degree distribution of nodes, especially a power law degree distribution, has been regarded as one of the most significant structural characteristics of social and information networks. Node degree, however, only discloses the first-order structure of a network. Higher-order structures such as the edge embeddedness and the size of communities may play more important roles in many online social networks. In this paper, we provide empirical evidence on the existence of rich higher-order structural characteristics in online social networks, develop mathematical models to interpret and model these characteristics, and discuss their various applications in practice. In particular, 1) We show that the embeddedness distribution of links in social networks has interesting and rich behavior that cannot be captured by well-known network models. 2) We formally prove that random k-tree, a recent model for complex networks, has a power law embeddedness distribution, and show empirically that the random k-tree model can be used to capture the rich behavior of higher-order structures we observed in real-world social network. 3) Going beyond the embeddedness, we show that a variant of the random k-tree model can be used to capture the power law distribution of the size of communities of overlapping cliques discovered recently.
Keywords
social networking (online); trees (mathematics); community size; edge embeddedness behavior; node degree distribution; online social networks; overlapping clique community; power law distribution; random k-tree model; Analytical models; Barium; Communities; Complex networks; Electronic mail; Mathematical model; Social network services;
fLanguage
English
Publisher
ieee
Conference_Titel
INFOCOM, 2011 Proceedings IEEE
Conference_Location
Shanghai
ISSN
0743-166X
Print_ISBN
978-1-4244-9919-9
Type
conf
DOI
10.1109/INFCOM.2011.5935223
Filename
5935223
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