Title :
RF and DC power handling characterization of thin film resistors embedded on LCP
Author :
Ponchak, George E. ; Jordan, Jennifer L. ; Horst, Stephen ; Papapolymerou, John
Author_Institution :
NASA Glenn Res. Center, Cleveland, OH
Abstract :
For the first time, the DC and RF power handling capability of NiCrAISi thin film resistors on liquid crystal polymer (LCP) is presented. It is shown that there is a maximum power that the resistors can handle without causing degradation of the resistors, and this value is significantly less than the power required for burn out of the resistors. ED AX shows that the resistors fail due to electromigration of Ni and Cr, and migration of C from the LCP.
Keywords :
aluminium compounds; chromium compounds; electromigration; liquid crystal polymers; nickel compounds; thin film resistors; DC power handling characterization; NiCrAlSi; RF characterization; electromigration; liquid crystal polymer; thin film resistors; Circuits; Coplanar waveguides; Polymer films; Radio frequency; Resistors; Switches; Temperature; Testing; Transistors; Voltage;
Conference_Titel :
Electronic Components and Technology Conference, 2008. ECTC 2008. 58th
Conference_Location :
Lake Buena Vista, FL
Print_ISBN :
978-1-4244-2230-2
Electronic_ISBN :
0569-5503
DOI :
10.1109/ECTC.2008.4550051
