DocumentCode :
1946546
Title :
A single chip dependable and adaptable payload Data Processing Unit
Author :
Kranitis, Nektarios ; Tsigkanos, Antonis ; Theodorou, George ; Sideris, Ioannis ; Paschalis, Antonis
Author_Institution :
Dept. of Inf. & Telecommun., Univ. of Athens, Athens, Greece
fYear :
2015
fDate :
6-8 July 2015
Firstpage :
138
Lastpage :
143
Abstract :
The current state-of-the-art space-grade reconfigurable SRAM FPGAs provide unprecedented levels of integration and performance and advanced features previously available only to commercial developers such as dynamic partial reconfiguration. On-board payload data processing based on an adaptable SRAM FPGA based hardware platform offers unique advantages over both one-time programmable anti-fuse FPGAs and ASICs, enabling an adaptable instrument with significant savings in mass, power, cost, resources and flexibility. In this paper, for the first time, we integrate the instrument system supervisor processor along with dedicated, adaptable and high-performance on-board data processing functions in a single-chip, dependable and adaptable payload Data Processing Unit (DPU), based on the space-grade Xilinx Virtex-5QV FPGA. The introduced single-chip DPU supports self-configuration management without the requirement of an external configurator/scrubber. Furthermore, a system-level SEE mitigation strategy is proposed that employs EDAC, TMR and internal scrubbing to guarantee total immunity under extremely harsh radiation environments. The functionality of the proposed single-chip DPU is validated using a hardware demonstrator platform that hosts the commercial equivalent (XC5VFX130T) of the space-grade Xilinx Virtex-5QV FPGA.
Keywords :
SRAM chips; aerospace computing; field programmable gate arrays; space vehicles; EDAC; TMR; dynamic partial reconfiguration; field programmable gate array; internal scrubbing; payload data processing unit; self-configuration management; single-chip DPU; space-grade Xilinx Virtex-5QV FPGA; space-grade reconfigurable SRAM FPGA; static random access memory; system-level SEE mitigation strategy; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
On-Line Testing Symposium (IOLTS), 2015 IEEE 21st International
Conference_Location :
Halkidiki
Type :
conf
DOI :
10.1109/IOLTS.2015.7229847
Filename :
7229847
Link To Document :
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