Title :
Effects of inductance on the metallization removal of exploding films
Author :
Muffoletto, M.T. ; Upia, Antonio ; DiSanto, T.M. ; Muffoletto, Daniel P. ; Burk, K.M. ; Zirnheld, Jennifer L. ; Moore, H.L. ; Singh, Harshavardhan ; Haney, Paul
Author_Institution :
Energy Syst. Inst., State Univ. of New York, Buffalo, NY, USA
Abstract :
During the electrical explosion of a thin metallized film, the metallization layer is heated rapidly up to vaporization where the film bursts and the metal layer is ejected from the substrate. It has been shown that adding inductance in the discharge path changes the characteristics of the explosion; most notably it alters the energy transfer efficiency. This work sets out to explore the metallization removed as a function of inductance, namely how much of the metallized surface is liberated during the explosion of the film. An image processing technique is used to quantify the metallization removal and the results of this effort are discussed herein.
Keywords :
discharges (electric); image processing; inductance; metallisation; discharge path; electrical explosion; exploding films; film bursts; image processing; inductance effects; metal layer; metallization removal; substrate; thin metallized film; Discharges; Explosions; Films; Inductance; Metallization; Optical switches;
Conference_Titel :
Pulsed Power Conference (PPC), 2011 IEEE
Conference_Location :
Chicago, IL
Print_ISBN :
978-1-4577-0629-5
DOI :
10.1109/PPC.2011.6191462