DocumentCode :
1946609
Title :
Microrelay packaging technology using flip-chip assembly
Author :
Miller, David C. ; Zhang, Wenge ; Bright, Victor M.
Author_Institution :
Dept. of Mech. Eng., Colorado Univ., Boulder, CO, USA
fYear :
2000
fDate :
23-27 Jan 2000
Firstpage :
265
Lastpage :
270
Abstract :
Using flip-chip assembly, micromachined connectors can be used to create a high density, actuatable electronics packaging technology. Internal residual stress is used to press bimorph beam connectors upwards against a device chip. Deformation can be increased by introducing stress through a heat treating process. The effects of heat treatment are more prominent on larger devices and are long lasting in nature. The connectors´ actuation behavior is described, including appropriate mathematical models. The electrostatically actuated beams will disconnect when driven by a 53 volt signal and will reconnect when voltage falls below 43 volts. When switching signals, reconnection occurs in as little as 5.8 μs, disconnection occurs in as little as 4.0 μs. A microconnector´s current carrying capability can be as high as 285.3 mA and its maximum power dissipation as high as 1.47 W
Keywords :
electrostatic actuators; flip-chip devices; heat treatment; semiconductor device packaging; semiconductor relays; MUMPS foundry process; bimorph beam connectors; current carrying capability; electrostatically actuated beams; flip-chip assembly; heat treatment effects; high density actuatable electronics packaging; internal residual stress; mathematical models; micromachined connectors; microrelay packaging; solder balls; Assembly; Connectors; Electrodes; Electronics packaging; Electrostatics; Gold; Microrelays; Probes; Prototypes; Residual stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Electro Mechanical Systems, 2000. MEMS 2000. The Thirteenth Annual International Conference on
Conference_Location :
Miyazaki
ISSN :
1084-6999
Print_ISBN :
0-7803-5273-4
Type :
conf
DOI :
10.1109/MEMSYS.2000.838527
Filename :
838527
Link To Document :
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