Title :
Time domain current waveform simulation of CMOS circuits
Author :
An-Chang Deng ; Yan-Chyuan Shiau ; Loh, K.-H.
Author_Institution :
Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
Abstract :
A time-domain current waveform simulator for the power buses of CMOS circuits is presented. The use of the simulated waveform helps solve VLSI reliability problems due to electromigration and excessive voltage drops in the power bus. Based on the event-driven technique and the precharacterized switch-level delay model, the simulator can handle circuits as large as 10/sup 3/ approximately 10/sup 4/ transistors in 10 approximately 100 CPU seconds on the Sun-3 workstation. The simulated waveform in worst cases may deviate only 20% from those computed by SPICE.<>
Keywords :
CMOS integrated circuits; VLSI; circuit analysis computing; delays; digital simulation; electric current; electromigration; reliability; 10 to 100 s; CMOS circuits; Sun-3 workstation; VLSI reliability; electromigration; event-driven technique; excessive voltage drops; power buses; precharacterized switch-level delay model; time-domain current waveform simulator; Circuit simulation; Computational modeling; Delay; Discrete event simulation; Electromigration; Semiconductor device modeling; Switching circuits; Time domain analysis; Very large scale integration; Voltage;
Conference_Titel :
Computer-Aided Design, 1988. ICCAD-88. Digest of Technical Papers., IEEE International Conference on
Conference_Location :
Santa Clara, CA, USA
Print_ISBN :
0-8186-0869-2
DOI :
10.1109/ICCAD.1988.122495
