Title :
An absolute frequency reference at 1556 nm for WDM communication systems
Author :
Poulin, M. ; Latrasse, C. ; Cyr, N. ; Tetu, M.
Author_Institution :
Dept. de Genie Electr., Laval Univ., Que., Canada
Abstract :
Standardization of channel frequency allocation and calibration of the frequency scale at 1.55 /spl mu/m will require some frequency standards in this range. A promising avenue consists of making use of the two-photon transitions of rubidium at 778 nm to frequency-lock a 1556 nm laser. These lines have been recently measured by direct comparison to the Cs frequency standard with an uncertainty of 2 kHz. The method which we develop consists in using the second harmonic of the 1556 nm laser to injection-lock a low-cost laser diode operating at 778 nm which is then used to observe the transitions in rubidium.
Keywords :
calibration; frequency allocation; laser frequency stability; laser mode locking; laser transitions; measurement standards; optical fibre communication; optical harmonic generation; rubidium; standardisation; telecommunication standards; wavelength division multiplexing; 1.55 mum; 1556 nm; 778 nm; Cs; Cs frequency standard; Rb; WDM communication systems; absolute frequency reference; calibration; channel frequency allocation; frequency scale; frequency standards; frequency-lock; injection-lock; low-cost laser diode; measurement errors; rubidium transitions; second harmonic; standardization; two-photon transitions; Frequency; Laser feedback; Laser modes; Laser transitions; Mirrors; Power lasers; Radio spectrum management; Resonance light scattering; Ring lasers; Wavelength division multiplexing;
Conference_Titel :
Vertical-Cavity Lasers, Technologies for a Global Information Infrastructure, WDM Components Technology, Advanced Semiconductor Lasers and Applications, Gallium Nitride Materials, Processing, and Devi
Conference_Location :
Montreal, Que., Canada
Print_ISBN :
0-7803-3891-X
DOI :
10.1109/LEOSST.1997.619147