DocumentCode :
1946755
Title :
Mining simulation metrics for failure triage in regression testing
Author :
Poulos, Zissis ; Veneris, Andreas
Author_Institution :
Dept. of ECE, Univ. of Toronto, Toronto, ON, Canada
fYear :
2015
fDate :
6-8 July 2015
Firstpage :
182
Lastpage :
187
Abstract :
Design debugging poses a major bottleneck in modern VLSI CAD flows, consuming up to 60% of the verification cycle. The debug pain, however, worsens in regression verification flows at the pre-silicon stage where myriads of failures can be exposed. These failures need to be properly grouped and distributed among engineers for further analysis before the next regression run commences. This high-level and complex debug problem is referred to as failure triage and largely remains a manual task in the industry. In this paper, we propose an automated failure triage flow that mines information from both failing and passing tests during regression, and automatically performs a coarse-grain partitioning of the failures. The proposed framework combines formal tools and novel statistical metrics to quantify the likelihood of specific design components being the root-cause of the observed failures. These components are then used to represent failures as high-dimensional objects, which are grouped by applying data-mining clustering algorithms. Finally, the generated failure clusters are automatically prioritized and passed to the best suited engineers for detailed analysis. Experimental results show that the proposed approach groups related failures together with 90% accuracy on the average, and efficiently prioritizes the responsible design errors for 86% of the exposed failures.
Keywords :
CAD; VLSI; data mining; electronic engineering computing; failure analysis; formal verification; integrated circuit testing; pattern clustering; program debugging; regression analysis; VLSI CAD flows; automated failure triage flow; coarse-grain partitioning; complex debug problem; data-mining clustering algorithms; design debugging; formal tools; high-dimensional objects; high-level debug problem; mining simulation metrics; pre-silicon stage; regression testing; specific design components; statistical metrics; verification cycle; Accuracy; Debugging; Frequency measurement; Measurement uncertainty; Silicon; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
On-Line Testing Symposium (IOLTS), 2015 IEEE 21st International
Conference_Location :
Halkidiki
Type :
conf
DOI :
10.1109/IOLTS.2015.7229856
Filename :
7229856
Link To Document :
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