Title :
Radar Target Signature Processing While Measuring in Near Field
Author :
Hu, Weidong ; Sun, Houjun ; Lv, Xin ; Li, Shiyong
Author_Institution :
Beijing Inst. of Technol.
Abstract :
Radar target signature is usually measured in near field using step frequency radar system, and Fourier-based methods are conventionally applied to signature processing, but bias lies between near field and far field. RCS is an important signature, which may be extrapolated by simple signal processing algorithm, some results are shown. The one-dimension downrange profiles are also researched based on a model, which is the foundation of image technology. While two dimension scattering centers distribution is measured, ISAR processing technology is used. We often solve the question by digital signal processing, electromagnetic field methods are also necessary to calculate wave scattering and illuminating, if two approaches are combined, maybe some interesting results can be obtained, which is a trend
Keywords :
Fourier transforms; electromagnetic fields; electromagnetic wave scattering; radar cross-sections; radar imaging; synthetic aperture radar; Fourier-based methods; ISAR processing technology; RCS; digital signal processing; electromagnetic field methods; extrapolation; image technology; near field; one-dimension downrange profiles; radar target signature processing; step frequency radar system; two dimension scattering centers distribution; wave illuminating; wave scattering; Electromagnetic measurements; Electromagnetic scattering; Frequency measurement; Pulse measurements; Radar antennas; Radar cross section; Radar measurements; Radar scattering; Signal processing; Signal processing algorithms;
Conference_Titel :
Signal Processing, 2006 8th International Conference on
Conference_Location :
Beijing
Print_ISBN :
0-7803-9736-3
Electronic_ISBN :
0-7803-9736-3
DOI :
10.1109/ICOSP.2006.346011