Title :
A new method to evaluate BGA pad cratering in lead-free soldering
Author :
Xie, Dongji ; Chin, Clavius ; Ang, KarHwee ; Lau, Dennis ; Shangguan, Dongkai
Author_Institution :
Flextronics Int., San Jose, CA
Abstract :
Pad cratering is one of the most important issues in lead- free soldering. The PCB materials change and the increased reflow temperature account for the degradation of the drop test performance of the PCB materials. This paper uses both finite element analysis (FEA) and experimental testing to study PCB pad lift and adhesion. The pad lift force in pull and shear tests has been determined with the test data, and a new cratering test using ball shear test was proposed for qualifying PCB BGA pads incorporating multiple reflows and mechanical loading.
Keywords :
ball grid arrays; circuit testing; finite element analysis; printed circuits; soldering; BGA pad cratering; PCB materials; ball shear test; finite element analysis; printed circuit board; Assembly; Delamination; Environmentally friendly manufacturing techniques; Lead; Materials science and technology; Materials testing; Soldering; Steel; Temperature; Thermal stresses;
Conference_Titel :
Electronic Components and Technology Conference, 2008. ECTC 2008. 58th
Conference_Location :
Lake Buena Vista, FL
Print_ISBN :
978-1-4244-2230-2
Electronic_ISBN :
0569-5503
DOI :
10.1109/ECTC.2008.4550082