Title :
High Temperature Characteristics of Gaa/soi Transistors and Circuits
Author :
Francis, P. ; Terao, A. ; Flandre, D.
Author_Institution :
Laboratoire de Microelectronique, Universite Catholique de Louvain, Belgium
Keywords :
CMOS technology; Circuits; Doping; Impedance; Inverters; Leakage current; MOS devices; Temperature dependence; Threshold voltage; Transconductance;
Conference_Titel :
SOI Conference, 1992. IEEE International
Conference_Location :
Ponte Vedra Beach, FL
Print_ISBN :
0-7803-7439-8
DOI :
10.1109/SOI.1992.664791
