Title :
Aliasing probability of non-exhaustive randomized syndrome tests
Author :
Aitken, R.C. ; Agarwal, V.K.
Author_Institution :
Dept. of Electr. Eng., McGill Univ., Montreal, Que., Canada
Abstract :
A comprehensive design methodology which includes built-in self-test (BIST) cannot be achieved without performance measures of BIST techniques. Exact and asymptotic expressions are derived for the aliasing probability of randomized syndrome testing using the independent error model proposed by T.W. Williams et al. (IEEE Trans. Computer-Aided Design, vol.7, no.1, p.75-83, 1988). It is shown that randomized syndrome testing outperforms signature analysis for a substantial class of functions, and that existing methods can be used to transform the remaining functions during test mode.<>
Keywords :
automatic testing; logic CAD; performance evaluation; BIST techniques; aliasing probability; asymptotic expressions; built-in self-test; comprehensive design methodology; exact expressions; independent error model; non-exhaustive randomized syndrome tests; performance measures; randomized syndrome testing; signature analysis; test mode; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Combinational circuits; Design for testability; Design methodology; Electric variables measurement; Registers; Turning;
Conference_Titel :
Computer-Aided Design, 1988. ICCAD-88. Digest of Technical Papers., IEEE International Conference on
Conference_Location :
Santa Clara, CA, USA
Print_ISBN :
0-8186-0869-2
DOI :
10.1109/ICCAD.1988.122500
