DocumentCode :
1947734
Title :
Attempt to a non-destructive Single Event Burnout test of Fast High Current Thyristors
Author :
Senaj, V. ; Ducimetiere, L.
Author_Institution :
CERN, Geneva, Switzerland
fYear :
2011
fDate :
19-23 June 2011
Firstpage :
797
Lastpage :
801
Abstract :
This paper describes an attempt to perform a non-destructive measurement of Single Event Burnout (SEB) failure rate of Fast High Current Thyristors (FHCT) when exposed to cosmic rays and to particle accelerator radiation. FHCTs are used as the power switching components of a beam abort system in the Large Hadron Collider (LHC) and their reliable operation is mandatory for the LHC safety.
Keywords :
failure analysis; nondestructive testing; particle accelerators; thyristors; SEB failure rate; beam abort system; cosmic rays; fast high current thyristors; large hadron collider; nondestructive measurement; nondestructive single event burnout test; particle accelerator radiation; power switching components; Capacitance; Cosmic rays; Current measurement; Fuses; Leakage current; Radiation effects; Resistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pulsed Power Conference (PPC), 2011 IEEE
Conference_Location :
Chicago, IL
ISSN :
2158-4915
Print_ISBN :
978-1-4577-0629-5
Type :
conf
DOI :
10.1109/PPC.2011.6191515
Filename :
6191515
Link To Document :
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