DocumentCode :
1947977
Title :
Limitations of incremental signal-tracing for FPGA debug
Author :
Hung, Eddie ; Wilton, Steven J E
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of British Columbia, Vancouver, BC, Canada
fYear :
2012
fDate :
29-31 Aug. 2012
Firstpage :
49
Lastpage :
56
Abstract :
Developing state-of-the-art custom silicon can be a prohibitively expensive and risky undertaking, due in no small part to the need to perform thorough design verification. Field-Programmable Gate-Arrays offer a flexible platform for constructing prototypes to aid in their verification, but unlike software simulation, observability into these prototypes is a major challenge. Designers can choose to insert trace-instrumentation to enhance on-chip observability, but doing so often requires re-compiling the entire design for each new trace configuration. This work presents two contributions: to explore the limitations of incremental-synthesis for trace-buffer insertion, and to propose CAD optimizations exclusive to this application for improving runtime and routability. We find that 99.4% of all used cluster outputs (driving both combinational and sequential circuit signals) can be incrementally-traced to 75% of the free memory-capacity on an FPGA, an order of magnitude quicker than the original compilation and with a nominal impact on circuit delay, for a 20% minimum channel width (10% area) increase.
Keywords :
buffer circuits; field programmable gate arrays; logic CAD; optimisation; CAD optimization; FPGA debug; combinational circuit signal; field-programmable gate-array; free memory-capacity; on-chip observability enhancement; sequential circuit signal; signal-tracing incremental synthesis; software simulation; trace-buffer insertion; Abstracts; Field programmable gate arrays; Wireless sensor networks;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Field Programmable Logic and Applications (FPL), 2012 22nd International Conference on
Conference_Location :
Oslo
Print_ISBN :
978-1-4673-2257-7
Electronic_ISBN :
978-1-4673-2255-3
Type :
conf
DOI :
10.1109/FPL.2012.6339240
Filename :
6339240
Link To Document :
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