Title :
Design of matching test structures [IC components]
Author_Institution :
Philips Res., Eindhoven, Netherlands
Abstract :
This paper discusses requirements for test structures for characterization of differences between identically designed IC-components (`matching´). A summary is given of the effects that can cause mismatch and measurement methods are discussed. This results in the definition of a set of matching test structures that enables proper characterization of mismatch. The approach is demonstrated with examples from a 1 μm BiCMOS process
Keywords :
integrated circuit testing; monolithic integrated circuits; 1 micron; BiCMOS process; IC-components; characterization; matched test structures; measurement methods; Differential amplifiers; Digital filters; Digital-analog conversion; Integrated circuit testing; Operational amplifiers; Photonic band gap; Resistors; Signal processing; Stochastic processes; Stochastic systems;
Conference_Titel :
Microelectronic Test Structures, 1994. ICMTS 1994. Proceedings of the 1994 International Conference on
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-1757-2
DOI :
10.1109/ICMTS.1994.303509
