Title :
Application of through mold via (TMV) as PoP base package
Author :
Kim, Jinseong ; Lee, Kiwook ; Park, Dongjoo ; Hwang, Taekyung ; Kim, Kwangho ; Kang, DaeByoung ; Kim, Jaedong ; Lee, ChoonHeung ; Scanlan, Christopher ; Berry, CJ ; Zwenger, Curtis ; Smith, Lee ; Dreiza, Moody ; Darveaux, Robert
Author_Institution :
R&D Center, Amkor Technol. Korea Inc., Seoul
Abstract :
In recent years, package-on-package (PoP) has been rapidly adopted for 3D integration of logic and memory within mobile handsets and other portable multimedia devices. However, existing methods of making the PoP base package may not satisfy next generation applications that will require reduced memory interface pitches, higher memory interface pin-counts, reduced thickness, tight warpage control and higher levels of integration within the PoP base package. This paper introduces a new PoP base package structure that addresses the challenges of next generation applications. A PoP base package with through mold vias (TMV) will be described. Package flatness and package stacking results will be presented and advantages of TMV technology will be reviewed.
Keywords :
integrated circuit packaging; integrated logic circuits; mobile handsets; moulding; portable instruments; printed circuit manufacture; soldering; 3D logic device integration; PoP base package; memory devices; memory interface pin-counts; memory interface pitches; mobile handsets; package flatness; package stacking; package-on-package; portable multimedia devices; through mold via; tight warpage control; Bonding; Logic devices; Memory architecture; Packaging; Stacking; Telephone sets; Testing; Thickness control; Vehicles; Wire;
Conference_Titel :
Electronic Components and Technology Conference, 2008. ECTC 2008. 58th
Conference_Location :
Lake Buena Vista, FL
Print_ISBN :
978-1-4244-2230-2
Electronic_ISBN :
0569-5503
DOI :
10.1109/ECTC.2008.4550110